Hamburg 2009 – scientific programme
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A: Fachverband Atomphysik
A 34: Poster II
A 34.31: Poster
Thursday, March 5, 2009, 16:30–19:00, VMP 9 Poster
Theoretical analysis of multiple ionization of Ar-ions in gas targets — •Gerald Schenk and Tom Kirchner — Institut für Theoretische Physik, TU-Clausthal, D-38678 Clausthal-Zellerfeld, Germany
Electron stripping cross sections for fast highly-charged ions in gas targets are of interest for various reasons, e.g. in the framework of the FAIR project at GSI. We have considered electron loss from sixfold and eightfold argon ions in helium and argon gases at 10 MeV/amu and 19 MeV/amu, respectively. Our calculations are based on a mean-field description of the electron dynamics and the nonperturbative basis generator method for orbital propagation.
In the case of Ar6+ we find that a considerable fraction of electron loss is due to ionization from the L shell. Consequently, LMM Auger processes can contribute to multiple electron loss of Ar6+ ions. In Ar8+ ionization of the K shell also occurs. Even though the probability is low, most K Auger processes must not be neglected if higher charge states are of interest. We have taken Auger processes into account and find indeed a major influence on the final charge-state distributions of the ions.