Hamburg 2009 – scientific programme
Parts | Days | Selection | Search | Downloads | Help
A: Fachverband Atomphysik
A 34: Poster II
A 34.40: Poster
Thursday, March 5, 2009, 16:30–19:00, VMP 9 Poster
Single-shot scattering experiments on clusters at the FLASH-FEL deliver insight into nm-length- and fs-timescale — •D. Rupp1, M. Adolph1, D. Wolter1, S. Schorb1, H. Thomas1, R. Unterumsberger1, R. Hartmann2, N. Kimmel2, L. Strüder2, T. Feigel3, A. Rudenko4, D. Rolles4, K.U. Kühnel5, J. Ullrich5, H. Wabnitz6, T. Laarmann6, R. Treusch6, T. Möller1, and C. Bostedt1 — 1IOAP / TU Berlin — 2MP Halbleiterlabor — 3Fraunhover IOF — 4ASG / MPG — 5MPI Kernphysik — 6DESY
Super-intense, ultrashort x-ray pulses from free-electron lasers allow imaging of nano structures with single-shot scattering experiments. The currently achievable resolution is given by the wavelength of the FLASH FEL in the nanometer regime. In the future atomic length scales of a few Angstrom can be investigated at the planned X-FELs.
We have performed single-shot scattering experiments at FLASH on single Xenon clusters with diameters comparable to the wavelength (20 to 150 nm). Our refocusing optics based on multilayer mirrors, yielded focal intensities up to 2· 1015 W/cm2. With high performance
pnCCDs we were able to aquire single-shot scattering images of one or two clusters in focus. Through simulations we identified geometrical information, as form, size and configuration. Analysis of the single cluster images via Mie’s theory provided information about the optical properties of the clusters during the interaction with the laser pulse. As the optical constants are correlated to the degree of ionization of the cluster plasma, we gain insight into the ultrafast dynamics on the femtosecond timescale.