Bonn 2010 – scientific programme
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T: Fachverband Teilchenphysik
T 61: Halbleiterdetektoren IV
T 61.7: Talk
Thursday, March 18, 2010, 18:20–18:35, HG ÜR 5
Comparison of Measurements of Charge Transfer Inefficiencies in a CCD with High-Speed Column Parallel Readout — •Andre Sopczak1, Khaled Bekhouche1, Chris Bowdery1, Michael Koziel1, Salim Aoulmit2, Dahmane Djendaoui2, Lakhdar Dehimi2, Nouredine Sengouga2, Craig Buttar3, Dzmitry Maneuski3, Chris Damerell4, Konstantin Stefanov4, Steve Worm4, Tim Greenshaw5, Tuomo Tikkanen5, Tim Woolliscroft5, Rui Gao6, Andrei Nomerotski6, and Zhige Zhang6 — 1Lancaster University, UK — 2Biskra University, Algeria — 3Glasgow University, UK — 4Rutherford Laboratory, UK — 5Liverpool University, UK — 6Oxford University, UK
Charge Coupled Devices (CCDs) have been successfully used in several high energy physics experiments over the past two decades. Their high spatial resolution and thin sensitive layers make them an excellent tool for studying short-lived particles. The Linear Collider Flavour Identification (LCFI) Collaboration has been developing Column-Parallel CCDs for the vertex detector of a future Linear Collider which can be read out many times faster than standard CCDs. The most recent studies are of devices designed to reduce both the CCD's intergate capacitance and the clock voltages necessary to drive it. A comparative study of measured Charge Transfer Inefficiency values between our previous and new results for a range of operating temperatures is presented.