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A: Fachverband Atomphysik

A 8: Poster I

A 8.55: Poster

Dienstag, 9. März 2010, 16:30–19:00, Lichthof

Auger processes in multielectron ionization of xenon atoms induced by intense XUV laser pulse — •Myroslav Zapukhlyak, Roland Guichard, Ulf Saalmann, and Jan-Michael Rost — Max-Planck-Institut für Physik komplexer Systeme, Nöthnitzer Straße 38, 01187 Dresden, Germany

Recent experiments at FLASH show that the intense XUV laser pulse can produce Xe ions with up to 21+ charge state [1]. At a photon frequency of 93 eV autoionization processes significantly affect the ionization and make a theoretical description very challenging. Ab-initio TDDFT calculations were performed for the time propagation of the system. In order to obtain q-fold ionization probabilities and to include the effect of autoionization we adopt a statistical model which was developed for the description of multielectron ionization in ion-atom collisions [2]. Our calculations show that this model is able to reproduce qualitatively the prominent features of the experimental data. Taking into account the experimental uncertainties of the laser pulse profile is necessary to get a quantitative agreement between the theoretical and experimental values.

[1] A. Sorokin et al., Phys. Rev. Lett. 99, 213002 (2007)

[2] T. Spranger and T. Kirchner, J. Phys. B 37, 4159 (2004)