Hannover 2010 – wissenschaftliches Programm
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K: Fachverband Kurzzeitphysik
K 4: Laseranwendungen und Lasermaterialbearbeitung I
K 4.2: Vortrag
Donnerstag, 11. März 2010, 11:00–11:15, F 442
Transient response of solids to intense fs soft X-Ray excitation — •Uladzimir Shymanovich1, Wei Lu1, Nikola Stojanovic2, Ryszard Sobierajski3,4, Mourad El Kharrazi1, Michael Vattilana1, Florian Quirin1, Vadym Suvorov1, Thorsten Brazda1, Stefan Düsterer2, Harald Redlin2, Rolf Treusch2, and Klaus Sokolowski-Tinten1 — 1Uni Duisburg-Essen, Duisburg — 2DESY, Hamburg — 3FOM-Inst. for Plasma Physics, Nieuwegein — 4Inst. of Physics Academy of Sciences,Warsaw
Short wavelength, femtosecond free-electron-lasers (FELs) open up new possibilities for generating high energy density states of matter. In particular, they permit strong electronic excitation of solid materials in a very controllable fashion since optical non-linearities (i.e. multi-photon absorption, free carrier absorption), which govern the high intensity light-material interactions at optical frequencies, are essentially absent. In this contribution we present results of time-resolved experiments performed at the XUV-FEL FLASH (HASYLAB/Hamburg) aimed to investigate the transient dynamics in solid materials upon irradiation with intense femtosecond XUV-pulses. In a XUV pump - optical probe experiment femtosecond time-resolved optical microscopy and imaging interferometry has been used to follow the transient changes of the optical properties of the XUV irradiated surfaces with spatial and temporal resolution. In many cases the observed behavior shows similarities to the case of ultrafast optical excitation. However, the large absorption depth of the XUV-radiation in some materials (i.e. Si) leads to distinct differences in the material response.