Hannover 2010 – wissenschaftliches Programm
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MS: Fachverband Massenspektrometrie
MS 4: Beschleunigermassenspektrometrie und Anwendungen I
MS 4.2: Vortrag
Mittwoch, 10. März 2010, 11:00–11:15, F 428
The potential of Accelerator Secondary Ion Mass Spectrometry for astrophysical applications — •Christof Vockenhuber1, Max Döbeli1, and Anton Wallner2 — 1ETH Zurich, Zurich, Switzerland — 2University of Vienna, Vienna, Austria
The understanding of the nuclear processes which formed the elements is based on the elemental abundances and their isotopic pattern. Astronomical observation allows to determine the elemental abundances; information of the isotopic pattern is obtained by mass spectrometry of meteoritic material. In particular, specific pre-solar grains, which preserved the isotopic composition of the early stage of our solar system, show strong deviations from the terrestrial isotopic pattern which can be attributed to different nucleosynthesis processes.
Since about 20 years pre-solar material has been analyzed using stable mass spectrometers, like SIMS, TIMS or ICPMS. However, especially elements in the rare earth region are difficult to measure due to the low concentrations and molecular interferences. The combination of a SIMS ion source with an AMS system allows for interference-free measurements. The potential and the challenges of this combination with prospects for future measurements will be discussed.