Regensburg 2010 – wissenschaftliches Programm

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BP: Fachverband Biologische Physik

BP 2: New Technologies

BP 2.6: Vortrag

Montag, 22. März 2010, 12:00–12:15, H43

Scanning Ion Conductance Microscopy vs. Atomic Force Microscopy in Cell Imaging — •Johannes Rheinlaender and Tilman E. Schäffer — Lehrstuhl für Angewandte Physik, Universität of Erlangen-Nürnberg, Staudtstr. 7, Bau A3, 91058 Erlangen, Deutschland

We performed a direct comparison of AFM and SICM by imaging the same fibroblast cell with both techniques in series. We thereby show the advantages and disadvantages of both techniques with respect to topography imaging of soft samples. The finite imaging force applied to the cell by the AFM tip causes vertical and lateral cell indentations, which we analyzed quantitatively. SICM imaging, on the other hand, is based on a non-contact imaging mechanism and provides true topography data. We show that thin, loosely-bound filopodia can be imaged with SICM at high resolution.
Rheinlaender, J. and T.E. Schäffer, J. Appl. Phys., 2009. 105(9): p. 094905