Regensburg 2010 – wissenschaftliches Programm

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CPP: Fachverband Chemische Physik und Polymerphysik

CPP 46: Focus: Charge Effects in Soft and Biological Matter II (jointly with BP)

CPP 46.10: Vortrag

Donnerstag, 25. März 2010, 17:00–17:15, H37

The conformation of poly(styrene sulfonate) layers physisorbed from salt solutions of different concentration studied on two different length scales: superposition of electrostatic and steric forces — •Stephan Block and Christiane A. Helm — Institut für Physik, Ernst-Moritz-Arndt Universität, Felix-Hausdorff-Str. 6, D-17489 Greifswald, Germany

AFM is used to measure the surface forces and to image sodium poly(styrene sulfonate) (PSS) layers physisorbed from NaCl solutions with an ionic strength ranging between 0 M and 1 M NaCl. Colloidal probe tapping mode imaging shows that domains of PSS brushes coexist with flatly adsorbed PSS. The brush area fraction increases with rising degree of polymerization and NaCl concentration in the adsorption solution. Colloidal probe technique reveals that the surface forces are a superposition of steric and electrostatic forces, their respective contribution is determined by the brush area fraction. Interestingly, the internal properties of the brush domains (i.e. brush thickness and average chain distance) are independent on the adsorption salt concentration and depend only on the degree of polymerization and (for the brush thickness) on the surrounding salt concentration. Using these complementary techniques we derive the scaling laws for the average chain distance and the brush thickness and area fraction. Thereby it is possible to form PSS brushes with the desired properties (brush thickness between 20 and 400 nm, brush area fraction between zero and full surface coverage) and hence to control the range and magnitude of the surface forces by choosing the appropriate preparation conditions.