Regensburg 2010 – scientific programme
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DF: Fachverband Dielektrische Festkörper
DF 3: Poster I: Nano- and microstructured dielectrics, surfaces and interfaces, dielectric composites
DF 3.10: Poster
Monday, March 22, 2010, 15:00–17:30, Poster D1
Experimental studies of dielectric constants in multi-layer systems — Axel Hommes1, Christian Krebs1, •Gört Luedtke2, Dirk Nüssler1, and Klaus Wandelt2 — 1Fraunhofer Institute for High Frequency Physics and Radar Techniques (FHR), Dep. mm-wave radar and high frequency sensors (MHS), Neuenahrer Straße 20, 53343 Wachtberg, Germany — 2University of Bonn, Institute for Physical and Theoretical Chemistry, Dep. Surfaces and Interfaces, Wegeler Str. 12, 53115 Bonn, Germany
The results of experimental studies of the dielectric properties of multi-layer systems and relevant absorption spectra will be presented. The measurements have been performed in the terahertz frequency range for different materials with varying layer thickness. Based on multi reflections in a multi layer structure, thickness measurement of single layers is a critical task for every measurement system. Reflections and interferences are unwanted influences during the measurement, but under well known conditions they can be utilized to characterize the layer thickness in multilayer structures. Based on the material parameters for the single layers like permittivity, attenuation etc. changes in the thickness of the different layers can be detected. An exact model of the multilayer structure is necessary including different attenuation coefficients, permittivities, etc. Based on this model changes in the layer thickness of the multilayer structure can be predicted. The estimation of layer thickness can be realized through continuous wave systems of the mmW or THz frequency range. The poster describes and compares modeling and first measurements with artificial structures.