Regensburg 2010 – scientific programme
Parts | Days | Selection | Search | Downloads | Help
DS: Fachverband Dünne Schichten
DS 29: Poster: Molecular Spintronics, Biomolecular and Functional Organic Layers, Organic Electronics and Photovoltaics, Plasmonics and Nanophotonics, Organic Thin Films, Nanoengineered Thin Films, Thin Film Characterisation,
DS 29.1: Poster
Wednesday, March 24, 2010, 15:00–17:30, Poster A
In-situ monitoring the growth of sexithiophenyl on Ag(110) by fast reflectance difference spectroscopy — Chunguang Hu1,2, •Lidong Sun1, Michael Hohage1, and Peter Zeppenfeld1 — 1Institut für Experimentalphysik, Johannes-Kepler-Universität Linz, Austria — 2State Key Lab of Precision Measuring Technology and Instruments, Tianjin University, China
A rotating compensator based reflectance difference spectrometer (RCRDS) has been developed for fast spectroscopic measurement of the evolution of optical properties of surfaces and thin films. As an example, the application of this new spectrometer to the in-situ monitoring the growth of sexithiophenyl (6T) thin films on Ag(110) will be reported. The evolution of the optical properties, i.e., absorption and polarization, of 6T thin films during growth are measured with a time resolution of 10 seconds in the photon energy range between 1.5 and 4.5 eV. The RD spectra show clearly that 6T grows on Ag(110) in a Stranski-Krastanov mode with a 2 ML thick wetting layer. Specifically, 6T molecules are lying flat on the surface and the long molecular axis in condensed phase is orientated preferentially along the [001] direction of Ag(110). The results demonstrate that RCRDS is a versatile tool for the in-situ, real time studies of thin film growth revealing detailed information on the nucleation and growth, as well as the molecular orientation and interactions.