Regensburg 2010 – scientific programme

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DS: Fachverband Dünne Schichten

DS 29: Poster: Molecular Spintronics, Biomolecular and Functional Organic Layers, Organic Electronics and Photovoltaics, Plasmonics and Nanophotonics, Organic Thin Films, Nanoengineered Thin Films, Thin Film Characterisation,

DS 29.39: Poster

Wednesday, March 24, 2010, 15:00–17:30, Poster A

Conductive Atomic Force Microscopy Investigations of Organic thin Films — •Andreas Pavitschitz¹, Igor Beinik¹, Markus Kratzer¹, Christian Teichert¹, Simone-Viola Radl², Thomas Griesser², and Wolfgang Kern² — ¹Institute of Physics, University of Leoben, 8700 Leoben, Austria — ²Institute of Chemistry of Polymeric Materials, University of Leoben, 8700 Leoben, Austria

Organic materials are used in electronic devices as dielectrics, semiconductors and conductive materials. The device performance depends on the electrical properties and the surface morphology of the organic thin film. Conductive Atomic Force Microscopy (C-AFM) allows simultaneous mapping of the morphology and the local film conductivity on the nanometer-scale. Access to details of carrier transport can be obtained by measuring local current - voltage (I/V) curves. In this study, C-AFM was used to investigate a UV sensitive conductive polymer. The polymer layers were prepared by spin coating on Au/glass and ITO. C-AFM proved a increase in conductivity in the polymer film after UV-exposure.

Support by the FWF projects S9702 N- 20, S9707 and P19636 is acknowledged.