Regensburg 2010 – wissenschaftliches Programm
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DS: Fachverband Dünne Schichten
DS 35: Biomolecular and Functional Organic Layers I (Focused Session)
DS 35.5: Topical Talk
Donnerstag, 25. März 2010, 18:30–19:00, H2
Infrared spectroscopic ellipsometry for the in-situ investigation of responsive polymer brushes — •Dennis Aulich1, Eva Bittrich2, Klaus-Jochen Eichhorn2, Petra Uhlmann2, Manfred Stamm2, Martin Brücher3, Roland Hergenröder3, Olha Hoy4, Igor Luzinov4, Norbert Esser1, and Karsten Hinrichs1 — 1Leibniz-Institut für Analytische Wissenschaften - ISAS - e.V., Albert-Einstein-Str. 9, 12489 Berlin — 2Leibniz-Institut für Polymerforschung Dresden e.V., Hohe Str. 6, 01069 Dresden — 3Leibniz-Institut für Analytische Wissenschaften - ISAS - e.V., Otto-Hahn-Str. 6b, 44227 Dortmund — 4School of Materials Science and Engineering, Clemson University, Clemson, SC 29634-0971, USA
Responsive polymer brushes offer a wide range of applications. Due to the possibility of changing the surface properties by external stimuli such as pH, solvent, temperature or electric field, mixed polymer brushes can control protein adsorption, wettability or adhesion of a surface. In order to understand the complex behavior of this surface functionalization, the single mechanisms like switching of polymer brushes and the adsorption of protein layers have to be well investigated. Infrared Spectroscopic Ellipsometry (IRSE) is a suitable method for in-situ measurements of polymer brush systems in solution and gives direct insight into the response of the brush to external stimuli by observation of the dissociation of charged groups in the polymer material. Various brush systems were investigated with in-situ IRSE and compared with additional methods such as VIS-ellipsometry, x-ray standing waves and contact angle measurements.