Regensburg 2010 – wissenschaftliches Programm
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DS: Fachverband Dünne Schichten
DS 46: Organic Thin Films III
DS 46.5: Vortrag
Freitag, 26. März 2010, 15:00–15:15, H8
Structural order of perfluoropentacene in fiber-textured and expitaxial films on amorphous and single crystalline substrates — •Ingo Salzmann1, Martin Oehzelt2, Steffen Duhm1, Bernhard Wedl3, Dmitrii Nabok4, Jürgen P. Rabe1, and Norbert Koch1 — 1Humboldt Universität zu Berlin, Germany — 2Johannes Kepler Universität Linz, Austria — 3Technische Universität Graz, Austria — 4Montanuniversität Leoben, Austria
Synchrotron X-ray diffraction reciprocal space mapping (RSM) was performed on fiber-textured perfluoropentacene (PFP) thin films on SiOx to determine the crystal structure of a monoclinic thin-film phase [1]. In a recent study, the growth of PFP on Ag(111) was investigated by X-ray standing waves and specular X-ray scattering reporting a flat adsorption geometry within the monolayer and a structural transition to an unknown (lying) herringbone structure upon subsequent growth [2]. We demonstrate an approach to solve unknown thin-film polymorphs on single crystalline substrates through a combination of RSM, X-ray diffraction pole figure technique (XRD-PF) and an appropriate variable substrate choice. Taking advantage of both the fiber-texture of Highly Ordered Pyrolytic Graphite (HOPG) and the low surface roughness we determined a structure solution of the triclinic polymorph of PFP/HOPG by RSM and proved the same to be present on Ag(111), Au(111) and Cu(111) by XRD-PF deriving the epitaxial relationships to the substrates.
[1] I. Salzmann et al., Langmuir, 24, 7294 (2008)
[2] S. Duhm et al., submitted.