Regensburg 2010 – scientific programme

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DS: Fachverband Dünne Schichten

DS 9: Poster: Synthesis of Nanostructured Films by Self-organization, Thermoelectric Thin Films and Nanostructures, High-k and Low-k Dielectrics, Layer Deposition Processes, Layer Growth, Layer Properties, Application of Thin Films, Surface Modification, Hard and Superhard Coatings, Metal Layers

DS 9.24: Poster

Monday, March 22, 2010, 15:00–17:30, Poster D1

A novel setup for thermopower measurements on thin films — •Peter Jost, Carl Schlockermann, and Matthias Wuttig — RWTH Aachen University, I. Physikalisches Institut, 52056 Aachen, Germany

Thermopower measurements are a common mean to gain insight into the electrical transport phenomena of metals and semiconductors. The typical method relies on making electrical contacts to the sample with two thermocouples. By measuring the voltages between the legs of the two thermocouples the temperature difference between the thermocouples' junctions and the thermoelectric voltage drop on the surface of the sample can be obtained. However, this technique is limited to moderate resistive samples as the measurement amplifiers have to meet the conflicting requirements of the low resistive thermocouples and the high resistive samples at the same time.

We have developed a novel setup that allows thermopower measurements on high resistive thin film samples. By setting the temperatures of both ends of the substrate to the temperatures of the underling copper blocks electrical contacts and temperature measurement can be decoupled. Thus, the amplifiers can be matched purely to the impedance of the sample. Furthermore this technique allows the deposition of an electrically isolating capping layer on top of the film of interest.

In this work we explain our setup and show the advantages and limitations of our method.