Regensburg 2010 – scientific programme

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HL: Fachverband Halbleiterphysik

HL 60: Poster II: Optical Properties, incl. Photonic Crystals and Ultrafast Phenomena

HL 60.32: Poster

Thursday, March 25, 2010, 18:00–20:00, Poster D1

Optical Near-Field Measurements on Arrays of Nanoscaled Holes in Gold Films — •Jens Ehlermann, Stephan Schwaiger, Markus Broell, Daniel Stickler, Detlef Heitmann, and Stefan Mendach — Institut für Angewandte Physik, Universität Hamburg, Jungiusstrasse 11, 20355 Hamburg

Scanning near field optical microscopy (SNOM) is a method to examine the distribution of the electromagnetic near field on a samples' surface [1,2]. Using our SNOM we are able to either excite or detect the electromagnetic field with a resolution of about 200 nm using a metallized tapered single mode fiber with a 200 nm aperture. This fiber is mounted on a xyz piezo stage and scans the sample to achieve a two-dimensional image of the topography and the field distribution. We present first near field images of an array of 180 nm holes with 500 nm periodicity in a 50 nm thick gold film. Such structures reveal an enhanced transmission [3] which is attributed to the excitation of surface plasmons [4]. We discuss the detection of these surface plasmons in our structures. We gratefully acknowledge support by the DFG through GrK 1286, SFB 508 and the LEXI Cluster 'Nano Spintronics'.

[1] A. Lewis et al., Ultramicroscopy 13, 227 (1984)

[2] D. W. Pohl et al., Applied Physics Letters 44, 651 (1984)

[3] Ebbesen et al. Nature 391, 667 (1998)

[4] U. Schröter and D. Heitmann, Phyical Review B 60, 4992 (1999)