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HL: Fachverband Halbleiterphysik
HL 62: Poster II: Photovoltaics and Organic Semiconductors
HL 62.27: Poster
Thursday, March 25, 2010, 18:00–20:00, Poster D2
Surface roughness, optical and spectroscopic properties of thin film systems based on Cu(In,Ga)Se2 absorbers — •Oliver Neumann1, Florian Heidemann1, Stephan J. Heise1, Rudolf Brüggemann1, Wolfram Witte2, and Gottfried H. Bauer1 — 1Institute of Physics, Carl von Ossietzky University Oldenburg, Germany — 2Zentrum für Sonnenenergie- und Wasserstoff-Forschung Baden-Württemberg, Stuttgart, Germany
We study the behaviour of the local properties like surface roughness, splitting of the quasi Fermi levels and optical threshold energies of thin film systems based on Cu(In,Ga)Se2 absorbers and consisting of substrate, back electrode, Cu(In,Ga)Se2 absorbers, buffer layer and front electrode. We imitate in-situ experiments with lateral resolution such as afm-topology, spectral transmission/absorption and spectral photoluminescence, which announces the splitting of the quasi-Fermi levels by statistical methods for feature extraction like 2D Fourier transforms and/or Minkowski-operations (opening functions) by analyzing films from different states of the growth process, say of different thicknesses. We moreover correlate the above mentioned lateral features for the identification of the origin of final grainy structures as well as for that of lateral inhomogeneities.