Regensburg 2010 – wissenschaftliches Programm

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KR: Fachverband Kristallographie

KR 10: Poster: Multiferroics (with MA, DF, KR, DS)

KR 10.43: Poster

Dienstag, 23. März 2010, 10:45–13:45, Poster A

In-Situ STM, LEED and MOKE Measurements of Ultrathin Epitaxially Flat Grown Fe Films on the GaAs(110) Surface — •Tim Iffländer, Martin Wenderoth, Thomas Druga, and Rainer G. Ulbrich — IV. Physikalisches Institut, Georg-August-Universität Göttingen

Fe films of up to 8 ML thickness were deposited on cleaved n-, p- and i-GaAs(110) in a two-step process combining low-temperature deposition at 130 K with a subsequent annealing to room temperature. Low-energy electron diffraction and scanning tunnelling microscopy suggest an abrupt interface without any considerable amount of compound formation and a flat continuous morphology with height variations in the monolayer range.

In-situ longitudinal magneto-optical Kerr effect measurements at RT were conducted for different in-plane orientations of the applied magnetic field with respect to the sample. In contrast to RT grown Fe films of 2-3 ML thickness, the easy and hard axes are interchanged, now parallel to the [001] and [110] directions, respectively. The hysteresis loop of films thicker than or equal to 5 ML is equivalent to magnetization curves observed in the case of RT grown films.

This work was supported by the SFB 602 TP A7.