Regensburg 2010 – scientific programme

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KR: Fachverband Kristallographie

KR 6: Topical Session Photovoltaic Materials II (with MM and BV MatWerk)

KR 6.4: Talk

Wednesday, March 24, 2010, 12:30–12:45, H4

Characterisation of thin C60 films using X-Ray methods — •Chris Elschner, Alexandr A. Levin, Christoph Schuenemann, Moritz Riede, and Karl Leo — TU Dresden, Institut für Angewandte Photophysik 01069 Dresden George-Bähr-Straße 1

C60 is a well known and often used molecule for state of the art organic solar cells. To increase the efficiency in these nanoscale systems, it is necessary to control the morphology of the thin film layers with the aim to optimize the electrooptical properties. Thin C60 film layers are produced via vacuum deposition under variation of substrate temperature from 30°C up to 90°C, film thickness from 25 nm to 50 nm, and vacuum chamber pressure. The characterisation of the film layers is carried out using x-ray reflection (XRR) and x-ray diffraction (XRD). From these results, the crystallinity, the film thickness, the roughness, and the density of the film layer can be estimated. Using the Scherrer equation, we estimate the average crystal size, which shows the existence of nanoscale crystals (10 nm) in a 50nm C60 film. These results are the base for the coming investigations of mixed organic layers for the use in organic solar cells.