Regensburg 2010 – scientific programme

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MA: Fachverband Magnetismus

MA 33: Poster II

MA 33.46: Poster

Friday, March 26, 2010, 11:00–14:00, Poster B1

Quantitative characterisation of magnetic force microscopy (MFM) tips in high homogeneous external magnetic fields — •Denny Köhler, Peter Milde, Ulrich Zerweck-Trogisch, and Lukas M. Eng — Institut für Angewandte Photophysik, Technische Universität Dresden

Measuring quantitative magnetic moments becomes one of the major tasks in nanomagnetic research. We present here a novel way to characterise Magnetic Force Microscopy (MFM) tips in high homogeneous external magnetic fields. The applied measurement technique bases on the deflection of the cantilever caused by the mechanical torque [1] which is induced by the external magnetic field.

Low temperature measurements of the frequency-shift, damping and static deflection of the cantilever in a variable external magnetic field are used to access the horizontal and vertical components of the magnetic moment of the tip. Amplitude and orientation of the magnetic moment is calculated quantitatively based on the analytic model of a harmonic oscillator.

The new characterisation technique is applied on hard- and soft-magnetic cantilevers, i.e. a whisker- type and a Co-coated MFM tip.

[1] T. Mizoguchi, Jpn. J. Appl.Phys. 43 (2004) 4610.