Regensburg 2010 – scientific programme

Parts | Days | Selection | Search | Downloads | Help

MM: Fachverband Metall- und Materialphysik

MM 26: Poster Session

MM 26.23: Poster

Tuesday, March 23, 2010, 14:45–16:30, Poster C

SPM Studies of Dislocations in Deformed Au Thin Films — •Sönke Schmidt¹, Alissa Wiengarten^1,2, and Cynthia A. Volkert¹ — ¹Institut für Materialphysik, Universität Göttingen — ²now at TU Berlin

The high strength of metal thin films relative to bulk materials is attributed to the inhibition of dislocation activation in small volumes, but the exact mechanisms are not clear. Studying dislocation-controlled deformation of thin films requires high resolution techniques such as TEM or SPM. In contrast to in-situ deformation in the TEM, in-situ SPM investigations do not require special sample preparation and provide quantitative Burgers vector information. However, they have poorer time resolution and can only image dislocations where they intersect the surface. In this study atomically flat gold thin films of about 100 nm thickness and a grain size of about 400 nm, produced by a template method on glass substrates, were investigated both in STM and AFM. Deformation of the films was performed by indentation of the tips into the sample surface. For future studies, these thin films will be transferred to deformable substrates, where they will be used for in-situ tensile test during AFM imaging.