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O: Fachverband Oberflächenphysik

O 22: Methods: Scanning probe techniques III

O 22.6: Vortrag

Dienstag, 23. März 2010, 11:45–12:00, H32

Advances in Quantitative Nanomechanical Mapping, and robust, user-friendly AFM tapping — •Johannes Kindt¹, Chanmin Su², Shuiqing Hu², and Bede Pittenger² — ¹Veeco GmbH, Dynamostr. 19, 68165 Mannheim — ²Veeco Metrology, 112 Robin Hill Road, Santa Barbara, CA 93117

The AFM has long been recognized for its ability to resolve surfaces at nm-resolution, and to probe mechanical properties and interactions on the sample surface by local mechanical measurement. However, until recently, the combination of these two capabilities was often a compromise between achievable imaging rate, and amount of property data collected - Examples are force volume maps collected over hours, or AFM images with a few select measurement points for mechanical properties. Here, we present recent advances in AFM technology that allow the collection of mechanical data (modulus, adhesion, deformation, dissipation) at normal AFM imaging rates. We also present an implementation of this technology that greatly simplifies AFM tapping operation while at the same time making it more robust, and the interaction more controlled.