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O: Fachverband Oberflächenphysik

O 22: Methods: Scanning probe techniques III

O 22.9: Vortrag

Dienstag, 23. März 2010, 12:30–12:45, H32

Dynamic Force Microscopy with Small Amplitudes at Ambient Conditions — •Elisabeth Köstner and Franz J. Gießibl — Institute for Experimental and Applied Physics, University of Regensburg, 93040 Regensburg

Yamada et al. [1,2] have shown that it is possible to obtain atomic resolution on cleaved mica and calcite in water with frequency-modulation force microscopy. These impressive results were acquired with a setup that enabled them to get very low deflection noise density, which is decisive for atomic resolution.

We have approached the problem of ambient condition imaging with quartz tuning fork based (qPlus) cantilevers. We tried to simplify our setup by using very stiff cantilevers (spring constant of 4300 N/m) with small amplitudes (around one nanometer). However, independent of the cantilever, small amplitudes appear to be necessary for high resolution imaging. Results made in frequency-modulation force microscopy mode with this setup are presented showing monoatomic steps on silicon in air and on calcite in PEG (polyethylenglycol).

[1] T. Fukuma, K. Kobayashi, K. Matsushige, and H. Yamada, Appl. Phys. Lett. 87, 034101 (2005)

[2] S. Rode, N. Oyabu, K. Kobayashi, H. Yamada and A. Kühnle, Langmuir 25, 2850-2853 (2009)