O 34: Methods: Scanning probe techniques IV
Tuesday, March 23, 2010, 15:00–16:15, H32
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15:00 |
O 34.1 |
Temperature Performance and Concept of an Ultra High Vacuum Compatible Dilution Refrigerator System for Scanning Tunneling Microscopy Applications — •Maximilian Assig, Fabian Zinser, Vladimir Shvarts, Zuyu Zhao, Christian R. Ast, and Klaus Kern
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15:15 |
O 34.2 |
Design of a combined Scanning Tunneling / Atomic Force Microscope working at low temperatures — •Matthias Emmrich, Anja Merkel, and Franz J. Giessibl
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15:30 |
O 34.3 |
A sub-Kelvin scanning tunneling microscope with high energy resolution and high stability — •Lei Zhang and Wulf Wulfhekel
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15:45 |
O 34.4 |
Quantum Point Contact Microscopy of a Noble Metal Surface — •Yong-hui Zhang, Peter Wahl, Jakob Bork, and Klaus Kern
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16:00 |
O 34.5 |
A calibration device for Scanning Thermal Microscopy based on the 3-ω-method — •Uli F. Wischnath, Adrian Czicholewski, and Achim Kittel
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