Regensburg 2010 – scientific programme

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O: Fachverband Oberflächenphysik

O 60: Poster Session III (Methods: Atomic and electronic structure; Methods: electronic structure theory; Methods: Molecular simulations and statistical mechanics; Methods: Sanning probe techniques; Methods: other (experimental); Methods: other (theory) )

O 60.11: Poster

Wednesday, March 24, 2010, 17:45–20:30, Poster B2

Atomic Force Microscopy meets Field Ion Microscopy — •Jens Falter¹, Daniel-Alexander Braun¹, Udo D. Schwarz³, Hendrik Hölscher², André Schirmeisen¹, and Harald Fuchs¹ — ¹Physikalisches Institut, University of Münster and CeNTech, Center for Nanotechnology, Münster, Germany — ²IMT, Forschungszentrum Karlsruhe, Germany — ³Department of Mechanical Engineering, Yale University, New Haven, USA

In atomic force microscopy (AFM), the contrast stems from the interaction between the probing tip and the sample. Although the AFM is even able to measure interaction forces with the force spectroscopy method, the underlying contrast mechanism is still not completely understood. In some extend this is due to the unknown tip shape in an AFM, which is able to resolve atomic resolution of sample surfaces - but not of the tip apex. The Field Ion Microscope (FIM) is a technique which resolves the apex of metal tips with atomic precision. The images of the tip gained with this method allow an atom by atom reconstruction of the foremost atom layers of the tip. We present our home-build system which combines these two microscope techniques: an AFM-head which has been proven to operate at low temperatures in ultra high vacuum [1] and a FIM, which can image the apex of the tungsten tip. The force sensor is based on a tuning fork in the q-plus concept [2] with an electrochemical etched tungsten tip at the end of the free prong. This setup enables us to perform force spectroscopy experiments with well characterized tips from the FIM images. [1] B.Albers et. al., Rev. Sci Instrum. 79 033704 (2008) [2] F.J.Giessibl, APL. 76 1470 (2000)