Regensburg 2010 – wissenschaftliches Programm
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O: Fachverband Oberflächenphysik
O 74: Nanostructures at surfaces: Other
O 74.12: Vortrag
Donnerstag, 25. März 2010, 17:45–18:00, H34
Nanocones and Nanowires Analysed with Scanning Auger Microscopy. — •Andrey Lyapin1, Stefan Reichlmaier1, Denis Paul2, John Hammond2, and Sakar Raman2 — 1Physical Electronics GmbH, Ismaning, Germany — 2Physical Electronics, Chanhassen, USA
The increased interest in nanotechnological material, such as nanocone, nanorods and nanowires, has pushed the development of analytical techniques to determine the growth mechanisms of these nanostructures. Scanning electron beam techniques, including Scanning Auger Microscopy, have provided valuable imaging and elemental characterization tools for these structures with a spatial resolution better than 10 nm. Using the combination of high energy resolution chemical state spectroscopy and imaging of the Scanning Auger Microscopy allows to obtain quantitative elemental results on the different parts of the nanocone and nanowire as well as the imaging of different chemical states and depth profiling. In this talk we present results of the Auger analysis of the nanocones and nanowires which provide further insights into the growth mechanisms of these nanostructures.