Regensburg 2010 – wissenschaftliches Programm
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O: Fachverband Oberflächenphysik
O 82: Graphene IV
O 82.3: Vortrag
Freitag, 26. März 2010, 11:45–12:00, H31
AFM imaging of graphene under ambient conditions — •Michael Enzelberger1, Viatcheslav Dremov1, Florian Speck2, Catharina Knieke3, Angela Berger3, Thomas Seyller2, Wolfgang Peukert3, and Paul Müller1 — 1Department of Physics and Interdisciplinary Center for Molecular Materials (ICMM), Universität Erlangen-Nürnberg, Germany. — 2Lehrstuhl für Technische Physik, Universität Erlangen-Nürnberg, Germany. — 3Lehrstuhl für Feststoff- und Grenzflächenverfahrens-technik, Universität Erlangen-Nürnberg, Germany.
Routine checks of graphene properties during device production can be facilitated significantly, when these measurements can be carried out under ambient conditions. We report on AFM investigations of epitaxial graphene on SiC(0001) and ball-milled graphite. Tapping-mode AFM and Kelvin-probe force microscopy (KPFM) were applied to reveal morphology and work function distribution. Although the absolute values of the work function differences are not meaningful under ambient conditions, the work function contrast from the KPFM data allows to distinguish between single-, bi- and trilayer graphene. Ball-milled graphite shows small flakes of single or multilayer graphene which are covered with surfactant molecules on either side. Also stacks of several graphene sheets separated by surfactant molecules were observed.