O 87: Methods: Other (experimental)
Freitag, 26. März 2010, 11:15–12:45, H42
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11:15 |
O 87.1 |
Determining the internal structure and morphology of nanoparticle films using element-specific X-ray techniques — •Marc Sauerbrey, Ardalan Zargham, Thomas Schmidt, Jan Ingo Flege, and Jens Falta
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11:30 |
O 87.2 |
Double Photoemission from Pb(111) — •Robert Wallauer, Stefan Voss, Till Jahnke, Achim Czasch, Lothar Schmidt, Nadine Neumann, Jasmin Titze, Hung-Keun Kim, Götz Berner, Michael Sing, Ralph Cleassen, Juan Carlos Campuzano, Horst Schmidt-Böcking, and Reinhard Dörner
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11:45 |
O 87.3 |
A fast, full multichannel reflectance difference spectrometer — •Chunguang Hu, Lidong Sun, Michael Hohage, and Peter Zeppenfeld
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12:00 |
O 87.4 |
SMART-II: the Next Generation of Aberration Corrected Spectro-Microscopy — Helder Marchetto, Marcel Springer, •Thomas Schmidt, and Hans-Joachim Freund
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12:15 |
O 87.5 |
Collinear Generation of ultrashort UV and XUV pulses for pump/probe spectroscopy — •Elisabeth Bothschafter, Agustin Schiffrin, Vladislav Yakovlev, Ferenc Krausz, Ralph Ernstorfer, and Reinhard Kienberger
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12:30 |
O 87.6 |
Surfaces of Customary Materials - a LEEM Study on Polycrystalline Iron — •Benjamin Borkenhagen, Thorsten Franz, Gerhard Lilienkamp, and Winfried Daum
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