Regensburg 2010 – wissenschaftliches Programm
Bereiche | Tage | Auswahl | Suche | Downloads | Hilfe
O: Fachverband Oberflächenphysik
O 87: Methods: Other (experimental)
O 87.1: Vortrag
Freitag, 26. März 2010, 11:15–11:30, H42
Determining the internal structure and morphology of nanoparticle films using element-specific X-ray techniques — •Marc Sauerbrey, Ardalan Zargham, Thomas Schmidt, Jan Ingo Flege, and Jens Falta — Institute of Solid State Physics, University of Bremen, 28359 Bremen, Germany
The nanoscopic structure of colloidal nanoparticle films is investigated using X-ray Standing Waves in Total External Reflection (TER-XSW) together with X-ray Reflectometry (XRR). The period of the standing wave field and the distance between the mirror surface and the antinodes are determined by the incidence angle (θ) of the X-ray beam. While varying θ, the interference pattern moves through the adsorbed particles and excites fluorescence. The detection of this angle-dependent fluorescence signal allows to draw conclusions on the vertical position of the nanoparticles with subnanometer resolution. As a model system we investigated an Au-coated Si substrate functionalized with a self-assembled monolayer (SAM) of hexadecanethiol covered by a monolayer of CoPt3 nanoparticles prepared by dip coating. Besides the determination of the vertical position of adsorbed particles, this technique also allows to resolve the internal structure of colloidal particles.