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TT: Fachverband Tiefe Temperaturen
TT 36: TR: Poster Session
TT 36.19: Poster
Donnerstag, 25. März 2010, 14:00–18:00, Poster A
Formation of metallic electrodes for molecular transport measurements by electromigration — •Birgit Kießig1,2, Wanyin Cui1,2, Kai Grube1, Regina Hofmann2, Dominik Stöffler2, and Roland Schäfer1 — 1Karlsruher Institut für Technologie, Institut für Festkörperphysik, Hermann-von-Helmholtz-Platz 1, 76344 Eggenstein-Leopoldshafen — 2Karlsruher Institut für Technologie, Physikalisches Institut, Wolfgang-Gaede-Straße 1, 76128 Karlsruhe
Molecular transport measurements require the fabrication of conductive electrodes spaced only a few nm apart. Electromigration of metallic nanostructures is a tool to achieve this aim which by now has been approved by several groups around the world.
We report on our own experience with electromigration of various materials, namely Au, Al and AuPd, using a feedback controlled electromigration process.
A dependence of the size of the resulting gaps on substrate and structure material as well as ambient temperature is observed. We mainly attribute this to different mechanisms and magnitude of heat transport from the nanostructures to the surroundings which results in different temperature profiles in the devices.
Furthermore we monitore structure thinning during electomigration in situ with a scanning electron microscope. At the same time resistance is measured and a simple model is used to explain the observed dependence of resistance on geometry.