Regensburg 2010 – scientific programme

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TT: Fachverband Tiefe Temperaturen

TT 9: SC: Poster Session

TT 9.15: Poster

Monday, March 22, 2010, 14:00–18:00, Poster A

Texture Development of Single Phase (R=Y,Ho,Lu) Rare Earth Nickel Borocarbide Thin Films onto MgO Substrates of Different Orientation and Mixed Phase (Ho_xLu_1−xNi₂B₂C) Thin Films on MgO(110) — •Tim Niemeier, Karolin Tscharntke, Ruben Hühne, Ludwig Schultz, and Bernhard Holzapfel — IFW Dresden, PF 270116, D-01171 Dresden

Epitaxial thin films of LuNi₂B₂C were deposited on MgO single crystal substrates using Pulsed Laser Deposition from a stoichiometric target. For optimized deposition parameters, a sharp c-axis texture and a high quality of the superconducting phase were achieved on MgO(100) [T_c = 15.6 K] as well as on MgO(110) [T_c = 15.8 K] substrates. Residual resistivity ratios are about 12 – 13 in the unstructured samples. Before this investigation, these properties are have not been reached independently from the substrate orientation. A far higher in-plane order is observed in the MgO(110) case for the chosen deposition parameters. To understand this behaviour, comprehensive texture investigations of the grown films on both substrate types were performed to reveal the differences in the growth processes. It is assumed that the growth mode of the rare earth oxide layer, forming in situ at the substrate interface is responsible for the different growth characteristics. Therefore, a detailed investigation of the texture of the oxide interface is performed as well. Finally, the texture formation of epitaxially grown mixed phase films Ho_xLu_1−xNi₂B₂C [see TT.598] is analyzed in dependence on their deposition parameters.