Dresden 2011 – wissenschaftliches Programm
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CPP: Fachverband Chemische Physik und Polymerphysik
CPP 11: Poster: New Instruments and Methods
CPP 11.15: Poster
Montag, 14. März 2011, 17:30–19:30, P2
Molecular orientation in soft matter thin films studied by resonant soft x-ray reflectivity — •Peter Reichert1, Markus Mezger1, Blandine Jérôme2, and Jeffrey B. Kortright2 — 1Max-Planck-Institut für Polymerforschung, Mainz — 2Materials Sciences Division, Lawrence Berkeley National Lab., USA
Polarization resolved Resonant Soft X-Ray Reflectivity is a novel technique to study depth profiles of molecular orientation in soft matter thin films with nanometer resolution. It combines the chemical sensitivity of Near-Edge X-ray Absorption Fine Structure spectroscopy to specific molecular bonds and their orientation with respect to the polarization of the incident beam with the precise depth profiling capability of X-ray reflectivity. We show polarization dependent reflectivity data from side chain liquid crystalline polymer thin films and their quantitative analysis using the Berreman formalism. Further examples on buried films and amorphous polymers where the orientation is induced by the free surface and the substrate demonstrate the capabilities of the technique.