Dresden 2011 – scientific programme

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CPP: Fachverband Chemische Physik und Polymerphysik

CPP 23: Poster: Semicrystalline Polymers, Polymer Crystallization and Self-Assembly

CPP 23.3: Poster

Tuesday, March 15, 2011, 18:00–20:00, P2

Multi-Setpoint Amplitude Modulation Atomic Force Microscopy on Soft Materials — •Eike-Christian Spitzner, Christian Riesch, Mario Zerson, and Robert Magerle — Chemische Physik, TU Chemnitz, D-09107 Chemnitz, Germany

We present an approach where pointwise measurement of amplitude and phase as function of tip sample distance is used to reconstruct amplitude modulation atomic force microscopy (AM-AFM) images. From one single-pass measurement, images for almost any amplitude setpoint are reconstructed. Furthermore, the position of the unperturbed surface, and the tip indentation into soft (compliant) specimens is determined. Tip indentation can be used as a depth coordinate to reconstruct depth-resolved cross-sections and volume images of the mechanical properties of the top 20 nm of soft polymeric specimens. The method overcomes most limitations of AM-AFM and allows for a better and more quantitative interpretation of height and phase images. The materials studied include block copolymer microdomains, crystalline lamella in elastomeric polypropylene, surfaces of poly(3-hexylthiophene), and supramolecular aggregates deposited on a substrate.