Dresden 2011 – scientific programme

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CPP: Fachverband Chemische Physik und Polymerphysik

CPP 23: Poster: Semicrystalline Polymers, Polymer Crystallization and Self-Assembly

CPP 23.8: Poster

Tuesday, March 15, 2011, 18:00–20:00, P2

Ellipsometry as a non-destructive tool for in-depth analysis of polymer/fullerene blend films — •Sebastian Engmann, Vida Turkovic, Harald Hoppe, and Gerhard Gobsch — Technische Universitaet Ilmenau, Fakultaet fuer Mathematik und Naturwissenschaften, Institut fuer Physik, Experimentalphysik I, Weimarer Strasse 32, 98693 Ilmenau, Germany

The validity of various optical descriptions/models in relation to the blending ratio of polymer/fullerene blends used in organic photovoltaics has been tested. Fullerene inclusions shape and the degree of polymer crystallinity inside the film have been investigated using Spectral Ellipsometry.