Dresden 2011 – scientific programme

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CPP: Fachverband Chemische Physik und Polymerphysik

CPP 8: Poster: Organic Semiconductors

CPP 8.49: Poster

Monday, March 14, 2011, 17:30–19:30, P2

Real time growth studies of organic-inorganic semiconductor hybrid structures — •Christopher Weber, Sebastian Bommel, and Stefan Kowarik — Institut für Physik der Humboldt Universität, 12489 Berlin, Deutschland

We combine time resolved optical and x-ray in situ methods to investigate the growth of organic semiconductor thin films on inorganic semiconductor substrates. We use organic molecular beam deposition (OMBD) to grow the organic semiconductor diindenoperylene (DIP) on three different ZnO surfaces. X-ray methods like X-Ray Reflectivity (XRR) and Gracing Incidence X-Ray Diffraction (GIXD) allow to determine the molecular alignment and roughness of the thin films. We also investigate the growth dynamics by simultaneous real time monitoring of anti-Bragg growth oscillations on different points in reciprocal space (q-space). Meanwhile optical methods like Differential Reflectance Spectroscopy (DRS) and Fluorescence Spectroscopy allow us to investigate the interdependency between structural and spectral changes during thin film growth. In this way we are able to study the correlation between molecular alignment and different surface termination of the substrates.