DS 10: Thin Film Characterisation: Structure Analysis and Composition (XRD, TEM, XPS, SIMS, RBS, ...) III
Montag, 14. März 2011, 14:00–15:30, GER 38
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14:00 |
DS 10.1 |
Structure and stability of laser deposited ZrO2/Ti and ZrO2/MgO multilayers — •Sarah Hoffmann, Benedikt Ernst, Tobias Liese, and Hans-Ulrich Krebs
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14:15 |
DS 10.2 |
Establishment of a structure zone model for the growth of reactively sputtered Titania thin films — •Azza Amin, Dominik Köhl, and Matthias Wuttig
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14:30 |
DS 10.3 |
Non-destructive species depth profile of nanolayered systems — •Beatrix Pollakowski and Burkhard Beckhoff
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14:45 |
DS 10.4 |
Crystallization and Oxygen loading in pulsed laser deposited YSZ-Films — •Benedikt Ernst, Tobias Liese, Sarah Hoffmann, and Hans-Ulrich Krebs
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15:00 |
DS 10.5 |
Hard X-ray photoelectron spectroscopy studies of newly designed charge transfer salts at PETRA III. — •Andrei Gloskovskii, Katerina Medjanik, Sebastian Thiess, Heiko Schulz-Ritter, Wolfgang Drube, Dennis Chercka, Martin Baumgarten, Klaus Müllen, Claudia Felser, and Gerd Schönhense
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15:15 |
DS 10.6 |
Transmission of ballistic electrons through metal–insulator–metal heterosystems — Johannes Hopster, Marika Schleberger, Lars Breuer, Andreas Wucher, Alexander Bernhart, Mark Kaspers, Christian Bobisch, Rolf Möller, and •Detlef Diesing
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