DS 11: Thin Film Characterisation: Structure Analysis and Composition (XRD, TEM, XPS, SIMS, RBS, ...) IV
Montag, 14. März 2011, 15:45–17:00, GER 38
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15:45 |
DS 11.1 |
Modeling of the relaxation kinetics of Phosphorus doped metastable tensile strained Si:C alloys — •Felix Ulomek, Ina Ostermay, Thorsten Kammler, and Volker Mohles
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16:00 |
DS 11.2 |
XPS depth profiling on polymers using Ar, C60, Coronene and Gas Cluster Ion Beam. — •Andrey Lyapin, Stefan Reichlmaier, John S. Hammond, John F. Moulder, Takuya Miyayama, Noriaki Sanada, Mineharu Suzuki, and Atsushi Takahara
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16:15 |
DS 11.3 |
Structure of FePt thin films with copper addition — •Herbert Schletter, Christoph Brombacher, Manfred Albrecht, and Michael Hietschold
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16:30 |
DS 11.4 |
Depth resolved Doppler broadening spectroscopy in thin metallic films — •Markus Reiner, Philip Pikart, and Christoph Hugenschmidt
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16:45 |
DS 11.5 |
Neutron Reflectometry and GISANS studies of Thin Films at Refsans — •Jean-François Moulin, Martin Haese-Seiller, Reinhard Kampmann, Matthias Pomm, and Andreas Schreyer
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