Dresden 2011 – wissenschaftliches Programm
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DS: Fachverband Dünne Schichten
DS 26: Plasmonics and Nanophotonics O-III (jointly with HL and O)
DS 26.7: Vortrag
Dienstag, 15. März 2011, 12:45–13:00, WIL A317
Background-Free Imaging with an Apertureless Scanning Nearfield Optical Microscope — •Moritz Eßlinger1, Jens Dorfmüller1,2, Ralf Vogelgesang1, Worawut Khunsin1, and Klaus Kern1,3 — 1Max-Planck-Institut für Festkörperforschung, 70569 Stuttgart, Germany — 2presently at 4. Physikalisches Institut, Universität Stuttgart, 70550 Stuttgart, Germany — 3de Physique de la Matière Condensée, École Polytechnique Fédérale de Lausanne, 1015 Lausanne, Switzerland
We present advances in experimental techniques of apertureless near-field optical microscopy (aSNOM). This technique achieves high spatial resolution by utilizing the field enhancement at the apex of sharp tips. Many conventional setups utilize p-polarized light in the illumination as well as in the detection path. The detected light of such a setup not only contains the optical near field signal, but is affected also by coupling effects between tip and sample.
By using p-polarized light for illumination and detecting the s-polarized component of the backscattered light we are able to measure the z-component of the electric field on the sample essentially without coupling effects. Here we outline how the proper choice of tip position, together with optimizing polarizer and analyzer angles of our cross-polarization scheme ensures plasmonic eigenmode mapping with a background of exactly zero. By comparison with simulation data not including the tip we show that the measurement has little to no influence on the eigenmodes.