Dresden 2011 – wissenschaftliches Programm

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DS: Fachverband Dünne Schichten

DS 42: Poster I: Progress in Micro- and Nanopatterning: Techniques and Applications (jointly with O); Spins in Organic Materials; Ion Interactions with Nano Scale Materials; Organic Electronics and Photovoltaics; Plasmonics and Nanophotonics (jointly with HL and O); High-k and Low-k Dielectrics (jointly with DF); Organic Thin Films; Nanoengineered Thin Films; Layer Deposition Processes; Layer Properties: Electrical, Optical, and Mechanical Properties; Thin Film Characterisation: Structure Analysis and Composition; Application of Thin Films

DS 42.26: Poster

Mittwoch, 16. März 2011, 15:00–17:30, P1

Orientation and interface properties of a promising low bang gap polymer for organic solar cells — •Umut Aygül¹, David Batchelor², Ulf Dettinger¹, Heiko Peisert¹, and Thomas Chassé¹ — ¹Universität Tübingen, Institut für Physikalische und Theoretische Chemie, Auf der Morgenstelle 18, 72076 Tübingen — ²Karlsruher Institut für Technologie, Institut für Synchrotron Strahlung, 76344 Eggenstein-Leopoldshafen

In polymer based bulk heterojunction-type solar cells so-called low band gap materials with alternating electron-deficient and electron-rich subunits are promising donor components in active layers to improve the efficiency of organic solar cells. A potential candidate in this context is Poly[2,6-(4,4-bis-(2-ethylhexyl)-4H-cyclopenta [2,1-b;3,4-b']dithiophene)-alt-4,7(2,1,3 benzothiadiazole) (PCPDTBT). The application of new materials requires a detailed understanding of the orientation and the electronic properties of the system and interface as these have a dramatic effect on device performance and efficiency. We study the electronic properties of interfaces between PCPDTBT and prototypical electrodes as well as between PCPDTBT and PCBM (acceptor) using X-ray photoemission spectroscopy (XPS) and valence band ultraviolet photoemission spectroscopy (UPS). Furthermore the preferred orientation of thin PCPDTBT films on both ITO and Si was studied with X-ray absorption spectroscopy (XAS) by looking at the sulphur K edge.