Dresden 2011 – wissenschaftliches Programm
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DS: Fachverband Dünne Schichten
DS 42: Poster I: Progress in Micro- and Nanopatterning: Techniques and Applications (jointly with O); Spins in Organic Materials; Ion Interactions with Nano Scale Materials; Organic Electronics and Photovoltaics; Plasmonics and Nanophotonics (jointly with HL and O); High-k and Low-k Dielectrics (jointly with DF); Organic Thin Films; Nanoengineered Thin Films; Layer Deposition Processes; Layer Properties: Electrical, Optical, and Mechanical Properties; Thin Film Characterisation: Structure Analysis and Composition; Application of Thin Films
DS 42.44: Poster
Mittwoch, 16. März 2011, 15:00–17:30, P1
Infrared Spectroscopic Ellipsometry Measurements of Polytriarylamine (PTAA) Thin Films — Jens Trollmann, Robert Lovrincic, •Akemi Tamanai, and Annemarie Pucci — Im Neuenheimer Feld 227, 69120 Heidelberg, Germany
Organic materials have been adopted for thin film fabrications since organic molecules are less expensive to produce, and high light absorbing capacity can be expected. For improving the electrical performance, investigation of the dielectric properties for the organic thin films is essential, hence Ψ and Δ measurements have been performed by means of spectroscopic ellipsometry (SE) (Woollam IR-VASE) so as to determine highly accurate dielectric constants (real and imaginary part) and thickness of polytriarylamine (PTAA) thin films (produced by Merck) in the infrared (IR) spectral range between 350 and 5500 cm−1. PTAA is an extraordinarily stable p-type semiconductor material which can be handled in air, high field-effect mobility of organic field-effect transistors (OFETs) fabricated together with PTAA and a low k insulator (low k dielectrics) has been reported. It is possible to obtain the bands not only from molecular vibrations, but also from excitations of free carriers with the SE which dominate the dielectric response of semiconductor thin films in the IR region.