Dresden 2011 – wissenschaftliches Programm

Bereiche | Tage | Auswahl | Suche | Aktualisierungen | Downloads | Hilfe

DS: Fachverband Dünne Schichten

DS 42: Poster I: Progress in Micro- and Nanopatterning: Techniques and Applications (jointly with O); Spins in Organic Materials; Ion Interactions with Nano Scale Materials; Organic Electronics and Photovoltaics; Plasmonics and Nanophotonics (jointly with HL and O); High-k and Low-k Dielectrics (jointly with DF); Organic Thin Films; Nanoengineered Thin Films; Layer Deposition Processes; Layer Properties: Electrical, Optical, and Mechanical Properties; Thin Film Characterisation: Structure Analysis and Composition; Application of Thin Films

DS 42.46: Poster

Mittwoch, 16. März 2011, 15:00–17:30, P1

In-situ protein adsorption study using spectroscopic IR-ellipsometry — •Philipp Gehlich, Andreas Furchner, Karsten Hinrichs, Norbert Esser, and Dennis Aulich — Leibniz-Institut für Analytische Wissenschaften - ISAS - e.V.; Albert-Einstein-Str. 9; 12489 Berlin; Germany

In-situ IR-ellipsometry was used to determine the differences in absorption spectra of bovine serum albumin (BSA) films on silicon in aqueous solution. A special flow-cell [1,2] which allows to record spectra at varying temperatures was employed. At an incident angle of 50° tan Ψ - spectra were recorded at different times of the adsorption process. Amide-I- and, partially, amide-II-bands of the thin protein film could be identified and a variation was monitored until the adsorption process was completed. References: [1] K. Hinrichs, K. Roodenko and J. Rappich, Electrochem. Commun. 10 (2008), p. 315.; [2] Y. Mikhaylova, L. Ionov, J. Rappich, M. Gensch, N. Esser, S. Minko, K.-J. Eichhorn, M. Stamm and K. Hinrichs, Anal. Chem. 79 (2007), p. 7676.