Dresden 2011 – wissenschaftliches Programm
Bereiche | Tage | Auswahl | Suche | Aktualisierungen | Downloads | Hilfe
DS: Fachverband Dünne Schichten
DS 42: Poster I: Progress in Micro- and Nanopatterning: Techniques and Applications (jointly with O); Spins in Organic Materials; Ion Interactions with Nano Scale Materials; Organic Electronics and Photovoltaics; Plasmonics and Nanophotonics (jointly with HL and O); High-k and Low-k Dielectrics (jointly with DF); Organic Thin Films; Nanoengineered Thin Films; Layer Deposition Processes; Layer Properties: Electrical, Optical, and Mechanical Properties; Thin Film Characterisation: Structure Analysis and Composition; Application of Thin Films
DS 42.49: Poster
Mittwoch, 16. März 2011, 15:00–17:30, P1
Thin films of ethyne-linked porphyrin dimers investigated by spectroscopic ellipsometry — •Simona Pop1, Peter Kate1, Aoife Ryan2, Xin Zhang3, Jörg Rappich3, Norbert Esser1, Karsten Hinrichs1, and Mathias Senge2 — 1Leibniz - Institut für Analytische Wissenschaften - ISAS - e.V., Albert-Einstein-Str.9, D-12489 Berlin, Germany — 2School of Chemistry, SFI Tetrapyrrole Laboratory, Trinity College Dublin, Dublin 2, Ireland — 3Helmholtz-Zentrum Berlin for Materials and Energy GmbH, Institute for Silicon Photovoltaics, Kekuléstrasse 5, Berlin, 12489, Germany
Thin films of ethyne-bridged porphyrin dimers are investigated by means of spectroscopic ellipsometry in the NIR-Vis spectral range. The porphyrin films were prepared on silicon substrates covered by the native oxide. For a better understanding of the optical behaviour of the porphyrin dimers, their corresponding monomers are additionally characterized. The dielectric functions of the porphyrin monomers and dimers are derived from ellipsometrical measurements by employing a three-phase optical model. The optical response of the porphyrin dimers is mainly characterized by red-shifts of the first absorption structure, Q-band, as well as by strong changes in the Q/B ratios, compared to the corresponding porphyrin monomers.