Dresden 2011 – scientific programme

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DS: Fachverband Dünne Schichten

DS 42: Poster I: Progress in Micro- and Nanopatterning: Techniques and Applications (jointly with O); Spins in Organic Materials; Ion Interactions with Nano Scale Materials; Organic Electronics and Photovoltaics; Plasmonics and Nanophotonics (jointly with HL and O); High-k and Low-k Dielectrics (jointly with DF); Organic Thin Films; Nanoengineered Thin Films; Layer Deposition Processes; Layer Properties: Electrical, Optical, and Mechanical Properties; Thin Film Characterisation: Structure Analysis and Composition; Application of Thin Films

DS 42.71: Poster

Wednesday, March 16, 2011, 15:00–17:30, P1

Investigations of Thin Films Derived from Nanocrystalline Silicon Powder applying Raman, Infrared Spectroscopy, and Spectroscopic Ellipsometry — •Falko Seidel¹, Ovidiu D. Gordan¹, Roy Buschbeck², Alexander Jakob², and Dietrich R. T. Zahn¹ — ¹Semiconductor Physics, Chemnitz University of Technology, D-09107 Chemnitz, Germany — ²Inorganic Chemistry, Chemnitz University of Technology, D-09107 Chemnitz, Germany

Thin film solar cells can have the advantage of being mechanically flexible and at the same time reducing material and production costs. At present, two main types of photovoltaic (PV) cells are found marketing applications: II-VI respectively II-III-VI compound semiconductors (CdTe, Cu(In,Ga)(S,Se)2 CIGS) and amorphous silicon (a-Si). The optical band gap of non-silicon CIGS PV cells can be tuned by changing the ratio of the incorporated elements. The most important advantage of Si is its availability. For application in solar cells it would be desirable to tune silicon properties as well. Thus, nanocrystalline silicon (nc-Si) is of great interest because of the band gap being tuneable with the particle size. The confinement effect leads to a shift of the optical band gap to higher energies. Additionally, the use of nanocrystalline powder makes price-efficient printing processes in the production feasible.

In this work optical characterisation of nc-Si powder and drop coated nc-Si films is presented using Raman Spectroscopy, Fourier Transform Infrared Spectroscopy (FTIRS), and Variable Angle Spectroscopic Ellipsometry (VASE).