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DS: Fachverband Dünne Schichten

DS 42: Poster I: Progress in Micro- and Nanopatterning: Techniques and Applications (jointly with O); Spins in Organic Materials; Ion Interactions with Nano Scale Materials; Organic Electronics and Photovoltaics; Plasmonics and Nanophotonics (jointly with HL and O); High-k and Low-k Dielectrics (jointly with DF); Organic Thin Films; Nanoengineered Thin Films; Layer Deposition Processes; Layer Properties: Electrical, Optical, and Mechanical Properties; Thin Film Characterisation: Structure Analysis and Composition; Application of Thin Films

DS 42.84: Poster

Mittwoch, 16. März 2011, 15:00–17:30, P1

Interdiffusion and Magnetic Properties of Buried Fe-Layers in Planar Cavities Containing C-matrix — •Balaram Sahoo1, Ralf Roehlsberger1, Kai Schlage1, Ulrich von Hoersten2, Werner Keune2, Heiko Wende2, Hans-Christian Wille1, Wolfgang Calibe1, Joern Donges1, Roman Chernikov1, Edmund Welter1, and Andre Rothkirch11Deutsches Elektronen Synchrotron DESY, Notkestr. 85, 22607, Hamburg, Germany — 2Universität Duisburg-Essen, Lotharstr. 1, D-47048 Duisburg, Germany

We report on the preparation of planar wave guides by DC magnetron sputtering with buried 57Fe-probe layers of varied thickness and the characterization of their interfaces and magnetism via X-ray diffraction (XRD), X-ray reflectivity (XRR), extended X-ray absorption fine structure (EXAFS) spectroscopy and 57Fe conversion-electron Mössbauer spectroscopy (CEMS). XRD, EXAFS and CEMS results suggests the amorphous nature of the diffused interface. CEMS results demonstrate that the Fe layers are paramagnetic at RT, when the Fe layer thickness was below 1.1 nm. A paramagnetic to ferromagnetic phase transition has been observed for increasing Fe layer thicknesses. In addition, intermixing between Fe and C atoms at the interfacial region has been observed as a distribution of magnetic hyperfine field in the CEM spectrum. The intermixing was estimated to be extended to about 1.2 nm on either side of the Fe layers; however, this is expected to be strongly dependent on the preparation method.

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DPG-Physik > DPG-Verhandlungen > 2011 > Dresden