Dresden 2011 – wissenschaftliches Programm

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DS: Fachverband Dünne Schichten

DS 43: Poster II: Thin Film Chalcogenide Photovoltaics; Thermoelectric Materials, Thin Films, and Nanostructures

DS 43.12: Poster

Mittwoch, 16. März 2011, 15:00–17:30, P2

3ω-measurements on ZnO/ZnS thin film structures — •Florian Gather, Achim Kronenberger, Peter J. Klar, and Bruno K. Meyer — I. Physikalisches Institut, Justus-Liebig-University, Heinrich-Buff-Ring 16, 35392 Giessen

We investigated the thermal conductivity of rf-sputtered ZnO/ZnS thin film layer structures. For this purpose a 3ω measurement system has been set up. It is based on a passive bridge circuit to eliminate the 1ω voltage component to facilitate a reliable measurement of the 3ω component. The samples can be heated as well as cooled, so that measurements can take place in a temperature range from 80 K to 400 K. In addition to the experimental setup, first measurements on ZnO/ZnS thin film layers will be presented. These will be carried out in a heater on top configuration and with different heater lengths on the same samples. The different Δ T curves are compared and the cross-plane thermal conductivities of the films will be evaluated for different temperatures.