Dresden 2011 – scientific programme
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DS: Fachverband Dünne Schichten
DS 43: Poster II: Thin Film Chalcogenide Photovoltaics; Thermoelectric Materials, Thin Films, and Nanostructures
DS 43.18: Poster
Wednesday, March 16, 2011, 15:00–17:30, P2
Investigation of thermal and electrical properties of individual nanostructures using specially designed microchips — •Daniel Huzel1,2, Heiko Reith1,2, Matthias C Schmitt1,2, Friedemann Völklein1, Roland Sachser2, and Michael Huth2 — 1Institut für Mikrotechnologien (IMtech), Hochschule RheinMain, Am Brückweg 26, D-65428 Rüsselsheim — 2Physikalisches Institut, Goethe-Universität, Max-von-Laue-Str. 1, D-60438 Frankfurt am Main
Our work focuses on the determination of thermal and electrical transport properties of individual thermoelectric nanostructures, in particular single nanowires. The Seebeck coefficient, electrical and thermal conductivity depend strongly on material, composition, crystallinity and geometric structure. To measure these coefficients, specially designed microchips have been developed and employed. FEM simulations demonstrate that the temperature profiles of the microchips show appropriate temperature gradients for Seebeck effect measurements and heat sink conditions for thermal conductivity investigations. Results of measurements on bismuth, bismuth-telluride and -antimonide nanowires are presented. The microchips have also been used for thermoelectric measurements on nano-granular metals prepared by focused electron beam induced deposition (FEBID).