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DS: Fachverband Dünne Schichten

DS 60: Thermoelectric Materials, Thin Films, and Nanostructures II (Focused Session -- Organisers: Nielsch, Rastelli, Balke)

DS 60.2: Talk

Friday, March 18, 2011, 14:15–14:30, GER 37

3ω measurements of half-Heusler thin films using a passive circuit — •Christian Mix, Tino Jäger, and Gerhard Jakob — Institut für Physik, Universität Mainz, Staudinger Weg 7, 55128 Mainz

One possibility to increase the thermoelectric Figure-of-Merit of thin films is to decrease the thermal conductivity, by replacing the thin film with a superlattice of the same thickness. This is one of the major challenges in ongoing research. For this purpose a 3ω-measurement system is built up to obtain the thermal conductivity of thin films. To nullify influences of active elements, a setup including a wheatstone bridge is used. Different aspects of the measurement system like the influence of thermal penetration depth and the energy losses by atmosphere are discussed. Additionally, first results on Half-Heusler thin films and superlattices are presented.