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Dresden 2011 – scientific programme

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DS: Fachverband Dünne Schichten

DS 8: Thin Film Characterisation: Structure Analysis and Composition (XRD, TEM, XPS, SIMS, RBS, ...) I

Monday, March 14, 2011, 10:15–11:45, GER 38

10:15 DS 8.1 Oberflächennahe Analytik mit Kleinwinkelröntgenstreuung im Labor — •Jörg Wiesmann, Peter Siffalovic, Jozef Keckes und Günther Maier
10:30 DS 8.2 BioRef - a versatile time-of-flight reflectometer for soft matter applications at Helmholtz-Zentrum Berlin für Materialien und Energie, Berlin — •Markus Strobl, Roland Steitz, Martin Kreuzer, Reiner Dahint, and Michael Grunze
10:45 DS 8.3 Comparison of quantitative X-Ray Fluorescence Spectrometry under normal and grazing incidence condition by means of buried nanolayers — •Rainer Unterumsberger, Beatrix Pollakowski, Matthias Müller, Burkhard Beckhoff, Wolfgang Ensinger, Peter Hoffmann, Tobias Adler, and Andreas Klein
11:00 DS 8.4 X-ray Reflectivity and Grazing Incidence X-ray Diffraction — •Markus Meyl, Bogdan Szymański, Arno Ehresmann, and Feliks Stobiecki
11:15 DS 8.5 Nucleation Mechanisms In High Energy Ion Beam Induced Dewetting — •Michael Haag, Daniel Garmatter, Redi Ferhati, Sankarakumar Amirthapandian, and Wolfgang Bolse
11:30 DS 8.6 Sophisticated analysis of the PDA of thin praseodymia films at temperatures up to 300°C — •Sebastian Gevers, Daniel Bruns, Alessandro Giussani, Thomas Schröder, and Joachim Wollschläger
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