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HL: Fachverband Halbleiterphysik

HL 26: Interfaces and Surfaces

HL 26.1: Vortrag

Montag, 14. März 2011, 16:00–16:15, POT 06

Focused Ion Beam Structuring of Ag Nanowires with Single Grain Boundaries for Electromigration Experiments — •Simon Sindermann, Christian Witt, Michael Horn-von Hoegen, Guenter Dumpich, and Frank-J. Meyer zu Heringdorf — Address: Faculty of Physics and Center for Nanointegration Duisburg-Essen (CeNIDE) University Duisburg-Essen, D-47057 Duisburg, Germany

Electromigration is decided by the balance of two opposing forces. On one hand the wind force acts via the momentum transfer from the conduction electrons to the atoms, on the other hand the so-called direct force arises from the electric field. Structural features have been shown to change the balance of the forces. Whereas the wind force dominates the electromigration in poly-crystalline Ag and Au nanowires [1], in single-crystalline Ag nanowires, the direct force drives the electromigration opposite to the direction of electron movement [2]. Here we present a new approach to study the electromigration in Ag nanowires with a single grain boundary. Focused ion beam (FIB) is used to structure wires from epitaxially grown Ag islands with two different crystallographic orientations, Ag(001) and Ag(111). While FIB structuring of Ag wires has promising prospects, there are some downsides as well. The issues, e.g. doping of the Si substrate and amorphisation, and possible solutions will be discussed. First electromigration experiments will be presented.

[1] B. Stahlmecke and G. Dumpich, JPCM 19 (2007) 046210

[2] B. Stahlmecke et al. APL 88 (2006) 053122