Dresden 2011 – scientific programme
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HL: Fachverband Halbleiterphysik
HL 44: Poster Session I
HL 44.43: Poster
Tuesday, March 15, 2011, 18:00–21:00, P3
In-situ TEM mechanical testing of InAs nanowires — •Marat Mukhametshin1, Vadim Migunov1, Zi-An Li1, Marina Spasova1, Andrey Lysov2, Werner Prost2, Ingo Regolin2, Franz-Josef Tegude2, and Michael Farle1 — 1Fakultät für Physik and CeNIDE — 2Fakultät für Ingenieurwissenschaften and CeNIDE University Duisburg-Essen, 47048 Duisburg, Germany
Recently, it became possible to measure the elastic properties of nanostructures by in-situ Transmission Electron Microscopy (TEM). The characteristic elastic quantities have already been implemented by several methods, such as electromechanical resonance, nanoindentation, tensile stress, bending and buckling testing [1]. In this study we used the "bending method" on InAs nanowires to obtain the bending modulus as the combination of shear and Young's modules by directly imaging the bending curvature in the TEM. The Metal Organic Chemical Vapor Deposition method was used to grow InAs nanowires on InAs (100) substrate from catalyst Au nanoparticles. Scratched and dispersed nanowires were preliminary aligned on standard TEM-grids using dielectrophoresis. A special Atomic Force Microscope in a TEM (AFM-TEM) sample holder was used to study the dependence of the mechanical properties of the nanowires on their diameter, growth direction, atomic structure and the presence of defects.
[1] Y. Zhu, C. Ke, H.D. Espinosa, Exp. Mech., 47, 7-24 (2007)