Dresden 2011 – scientific programme
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HL: Fachverband Halbleiterphysik
HL 45: Joint Poster Session
HL 45.17: Poster
Tuesday, March 15, 2011, 18:00–21:00, P1
Photoconductive AFM-Measurements to prove the Meyer-Neldel Rule in C60 films — •Astrid Wachauer1, Igor Beinik1, Markus Kratzer1, Mujeeb Ullah2, Helmut Sitter2, Andrey Kadashchuk3, and Christian Teichert1 — 1Institute of Physics, University of Leoben, Franz Josef Straße 18, A-8700 Leoben, Austria — 2Institute of Semiconductor and Solid State Physics, Johannes Kepler University of Linz, A-4040 Linz, Austria — 3Institute of Physics, National Academy of Science of Ukraine, Prospect Nauky 46, 03028 Kyiv, Ukraine
The Meyer-Neldel rule (MNR) provides a link between the activation energy and the pre-exponential factor of a thermally activated process (e.g. electrical transport in organic semiconductors). Recently, it has been demonstrated that the MNR for the temperature dependences of the charge carrier mobility is fulfilled upon varying the charge carrier concentration in organic semiconductors [1]. In this study, we applied Photoconductive Atomic Force Microscopy (PC-AFM) in order to investigate the temperature dependence of the photocurrent in C60 thin films under different degrees of illumination. The films were grown on ITO by Hot Wall Epitaxy and measured with PC-AFM in inert atmosphere. The charge carrier concentration was modulated by varying the intensity of the Xe 150W light source. Besides verifying the MNR, we observed a variation in the conductivity of the crystalline C60 including almost nonconductive grains. Supported by Austrian Science Fund (FWF) NFN projects S9706-N20, S9707-N20 and P19636.
M. Ullah, et al., Appl. Phys. Lett. 96, 213306 (2010).